Francisco Andre Correa Alegria
AuthID: R-000-59K
31
TÃTULO: Design, Characterization and Calibration of a Short-Period Ocean Bottom Seismometer (OBS)
AUTORES: Shariat Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
AUTORES: Shariat Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLICAÇÃO: 2008, FONTE: 25th IEEE Instrumentation and Measurement Technology Conference in 2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5
INDEXADO EM: 
Scopus 
WOS
Scopus WOS NO MEU: 
ORCID
ORCID32
TÃTULO: Design, Characterization and Calibration of a Short-Period Ocean Bottom Seismometer (OBS)
AUTORES: Shariat-Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLICAÇÃO: 2008, FONTE: 2008 IEEE Instrumentation and Measurement Technology Conference
AUTORES: Shariat-Panahi, S; Manuel, A; Alegria, F; Roset, X; Bermudez, A; Sallares, V;
PUBLICAÇÃO: 2008, FONTE: 2008 IEEE Instrumentation and Measurement Technology Conference
33
TÃTULO: Characterization of a high resolution acquisition system for marine geophysical applications Full Text
AUTORES: Panahi, SS; Alegria, F; Manuel, A;
PUBLICAÇÃO: 2006, FONTE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
AUTORES: Panahi, SS; Alegria, F; Manuel, A;
PUBLICAÇÃO: 2006, FONTE: IMTC'06 - IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference
34
TÃTULO: Uncertainty of estimates obtained with the histogram test of ADCS
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2006, FONTE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2006, FONTE: 18th IMEKO World Congress 2006: Metrology for a Sustainable Development in 18th IMEKO World Congress 2006: Metrology for a Sustainable Development, VOLUME: 3
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID35
TÃTULO: Signal Discrimination in Superheated Droplet Detectors
AUTORES: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLICAÇÃO: 2006, FONTE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
AUTORES: Felizardo, M; R.C Martins; A.R Ramos; Morlat, T; Giuliani, F; J.G Marques; Limagne, D; Waysand, G; A.C Fernandes; T.A Girard; Alegria, F;
PUBLICAÇÃO: 2006, FONTE: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings
36
TÃTULO: Signal discrimination in superheated droplet detectors
AUTORES: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
AUTORES: Felizardo, M ; Martins, RC ; Ramos, AR ; Morlat, T; Giuliani, F; Marques, JG ; Limagne, D; Waysand, G; Fernandes, AC ; Girard, TA ; Alegria, F;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 2
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID37
TÃTULO: Precision of ADC gain and offset error estimation with the standard histogram test
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
AUTORES: Alegria, FC; Serra, AC ;
PUBLICAÇÃO: 2005, FONTE: IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference in Conference Record - IEEE Instrumentation and Measurement Technology Conference, VOLUME: 1
INDEXADO EM: Scopus
Scopus NO MEU: ORCID
ORCID