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TITLE: High-depth-resolution Rutherford backscattering data and error analysis of SiGe systems using the simulated annealing and Markov chain Monte Carlo algorithms
AUTHORS: Barradas, NP ; Knights, AP; Jeynes, C; Mironov, OA; Grasby, TJ; Parker, EHC;
PUBLISHED: 1999, SOURCE: PHYSICAL REVIEW B, VOLUME: 59, ISSUE: 7
INDEXED IN: Scopus WOS CrossRef