D. V. Yurasov
AuthID: R-00H-016
1
TÃTULO: Quantitative depth profiling of Si1-xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry Full Text
AUTORES: Drozdov, MN; Drozdov, YN; Csik, A; Novikov, AV; Vad, K; Yunin, PA; Yurasov, DV; Belykh, SF; Gololobov, GP; Suvorov, DV; Tolstogouzov, A;
PUBLICAÇÃO: 2016, FONTE: THIN SOLID FILMS, VOLUME: 607
AUTORES: Drozdov, MN; Drozdov, YN; Csik, A; Novikov, AV; Vad, K; Yunin, PA; Yurasov, DV; Belykh, SF; Gololobov, GP; Suvorov, DV; Tolstogouzov, A;
PUBLICAÇÃO: 2016, FONTE: THIN SOLID FILMS, VOLUME: 607
