Xin Li
AuthID: R-00H-4F7
1
TÃTULO: A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits
AUTORES: Hugo R. Gonçalves; Xin Li; Miguel V. Correia ; Vitor Tavares; John Carulli Carulli Jr.; Kenneth M. Butler;
PUBLICAÇÃO: 2015, FONTE: 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 in Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, VOLUME: 2015-April
AUTORES: Hugo R. Gonçalves; Xin Li; Miguel V. Correia ; Vitor Tavares; John Carulli Carulli Jr.; Kenneth M. Butler;
PUBLICAÇÃO: 2015, FONTE: 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 in Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015, VOLUME: 2015-April
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