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TÍTULO: CPM-characterization of light and current stressed a-Si:H diodes with nin, pip, and pin structures  Full Text
AUTORES: Ostendorf, HC; Schwarz, R; Kusian, W; Kruhler, W;
PUBLICAÇÃO: 1993, FONTE: Proceedings of the 23rd IEEE Photovoltaic Specialists Conference in Conference Record of the IEEE Photovoltaic Specialists Conference
INDEXADO EM: Scopus