Sai Krishna Narayananellore
AuthID: R-00J-KQS
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TÃTULO: Thickness dependence of degree of B2 order of polycrystalline Co-2(Mn0.6Fe0.4)Ge Heusler alloy films measured by anomalous X-ray diffraction and its impacts on current-perpendicular-to-plane giant magnetoresistance properties
AUTORES: Tomoya Nakatani; Sai Krishna Narayananellore; Loku Singgappulige Rosantha Kumara; Hiroo Tajiri; Yuya Sakuraba; Kazuhiro Hono;
PUBLICAÇÃO: 2020, FONTE: SCRIPTA MATERIALIA, VOLUME: 189
AUTORES: Tomoya Nakatani; Sai Krishna Narayananellore; Loku Singgappulige Rosantha Kumara; Hiroo Tajiri; Yuya Sakuraba; Kazuhiro Hono;
PUBLICAÇÃO: 2020, FONTE: SCRIPTA MATERIALIA, VOLUME: 189
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