U. Konig
AuthID: R-00J-N7D
1
TÃTULO: Evaluation of the infrared absorption in nm-thick heavily boron-doped Si1-xGex layers on silicon Full Text
AUTORES: Cavaco, A; Sobolev, NA; Carmo, MC; Presting, H; Konig, U;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Materials in Microelectronics in JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, VOLUME: 12, NÚMERO: 4-6
AUTORES: Cavaco, A; Sobolev, NA; Carmo, MC; Presting, H; Konig, U;
PUBLICAÇÃO: 2001, FONTE: 3rd International Conference on Materials in Microelectronics in JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, VOLUME: 12, NÚMERO: 4-6
