M. Fleischauer
AuthID: R-00J-VPV
1
TÃTULO: Ballistic electron emission microscopy studies of ZnSe-BeTe heterojunctions
AUTORES: Chahboun, A; Fink, V; Fleischauer, M; Kavanagh, KL; Lu, RP; Hansen, L; Becker, CR; Molenkamp, LW;
PUBLICAÇÃO: 2002, FONTE: Proceedings of the 29th Conference on the Physics and Chemistry of Semiconductor Interfaces in Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, VOLUME: 20, NÚMERO: 4
AUTORES: Chahboun, A; Fink, V; Fleischauer, M; Kavanagh, KL; Lu, RP; Hansen, L; Becker, CR; Molenkamp, LW;
PUBLICAÇÃO: 2002, FONTE: Proceedings of the 29th Conference on the Physics and Chemistry of Semiconductor Interfaces in Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, VOLUME: 20, NÚMERO: 4
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