2
TÍTULO: Strategies to Improve Synchronous Dataflows Analysis Using Mappings between Petri Nets and Dataflows
AUTORES: Jose Inacio Rocha; Octavio Pascoa Dias; Luis Gomes;
PUBLICAÇÃO: 2014, FONTE: 5th IFIP WG 5.5/SOCOLNET Doctoral Conference on Computing, Electrical and Industrial Systems (DoCEIS) in TECHNOLOGICAL INNOVATION FOR COLLECTIVE AWARENESS SYSTEMS, VOLUME: 423
INDEXADO EM: WOS
3
TÍTULO: Exploiting dataflows and Petri nets mappings
AUTORES: Jose Inacio Rocha; Octavio Pascoa Dias; Luis Gomes;
PUBLICAÇÃO: 2013, FONTE: 11th IEEE International Conference on Industrial Informatics (INDIN) in 2013 11TH IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS (INDIN)
INDEXADO EM: Scopus WOS CrossRef
4
TÍTULO: Analysing Storage Resources on Synchronous Datafiows using Petri Net Verification Techniques
AUTORES: Jose Inacio Rocha; Luis Gomes ; Octavio Pascoa Dias;
PUBLICAÇÃO: 2012, FONTE: 38th Annual Conference on IEEE-Industrial-Electronics-Society (IECON ) in 38TH ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS SOCIETY (IECON 2012)
INDEXADO EM: Scopus WOS CrossRef
5
TÍTULO: Petri Net Verification Techniques on Synchronous Dataflow Models
AUTORES: Jose Inacio Rochat; Luis Gomes ; Octavio Pascoa Dias;
PUBLICAÇÃO: 2011, FONTE: ICELIE/IES Industry Forum/37th Annual Conference of the IEEE Industrial-Electronics-Society (IECON) in IECON 2011: 37TH ANNUAL CONFERENCE ON IEEE INDUSTRIAL ELECTRONICS SOCIETY
INDEXADO EM: Scopus WOS
6
TÍTULO: Dataflow Model Property Verification Using Petri net Translation Techniques
AUTORES: Jose Inacio Rocha; Luis Gomes ; Octavio Pascoa Dias;
PUBLICAÇÃO: 2011, FONTE: 9th IEEE International Conference on Industrial Informatics (INDIN) in 2011 9TH IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS (INDIN)
INDEXADO EM: Scopus WOS CrossRef
7
TÍTULO: Design and implementation of a reconfigurable remote laboratory, using oscilloscope/PLC network for WWW access  Full Text
AUTORES: Rui Marques; Jaime Rocha; Silviano Rafael; Martins, JF ;
PUBLICAÇÃO: 2008, FONTE: IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, VOLUME: 55, NÚMERO: 6
INDEXADO EM: Scopus WOS CrossRef