Effect of Annealing on Aln/Gan Quantum Dot Heterostructures: Advanced Ion Beam Characterization and X-Ray Study of Low-Dimensional Structures

AuthID
 P-003-2Q6
9
Author(s)
Amstatt, B
·
Fellmann, V
·
Daudin, B
Tipo de Documento
Article
Year published
2010
Publicado
in SURFACE AND INTERFACE ANALYSIS, ISSN: 0142-2421
Volume: 42, Número: 10-11, Páginas: 1552-1555 (4)
Conference
7Th International Symposium on Atomic Level Characterizations for New Materials and Devices, Date: DEC 06-11, 2009, Location: Maui, HI, Patrocinadores: Japanese Soc Promot Sci, 141st Comm Microbeam Anal
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Publication Identifiers
SCOPUS: 2-s2.0-78149434154
Wos: WOS:000282668800009
Source Identifiers
ISSN: 0142-2421
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