Effect of Low Level Contamination on Tial Alloys Studied by Sims

AuthID
 P-000-9Y5
4
Author(s)
Tipo de Documento
Article
Year published
2004
Publicado
in APPLIED SURFACE SCIENCE, ISSN: 0169-4332
Volume: 231, Páginas: 854-858 (5)
Conference
14Th International Conference on Secondary Ion Mass Spectrometry (Sims 14), Date: SEP 14-19, 2003, Location: San Diego, CA
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Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-2942625687
Wos: WOS:000222427700170
Source Identifiers
ISSN: 0169-4332
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