Thin Film Depth Profiling Using Simultaneous Particle Backscattering and Nuclear Resonance Profiling

AuthID
 P-003-6FH
6
Author(s)
Tipo de Documento
Article
Year published
2010
Publicado
in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X
Volume: 268, Número: 11-12, Páginas: 1829-1832 (4)
Conference
19Th International Conference on Ion Beam Analysis, Date: SEP 07-11, 2009, Location: Univ Cambridge, Cambridge, ENGLAND, Host: Univ Cambridge
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Publication Identifiers
SCOPUS: 2-s2.0-77953128092
Wos: WOS:000278702300030
Source Identifiers
ISSN: 0168-583X
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