Charge Collection Efficiency of Single Gan Core-Shell Wires Assessed by High-Precision Ion-Beam-Induced Charge Measurements

AuthID
 P-010-34Z
11
Author(s)
Verheij, D
·
Vicentijevic, M
·
Jaksic, M
·
Peres, M
·
Alves, E
·
Durand, C
·
Eymery, J
·
Möller, W
·
Tipo de Documento
Article in Press
Year published
2024
Publicado
in ACS APPLIED ELECTRONIC MATERIALS, ISSN: 2637-6113
Volume: 6, Número: 3, Páginas: 1682-1692 (11)
Indexing
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Scopus®
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-85186093315
Wos: WOS:001175046100001
Source Identifiers
ISSN: 2637-6113
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