Impact of Radiation Damage on the Photoconductor and Photodiode Properties of Gan Core-Shell P-N Junction Microwires

AuthID
 P-010-YGR
8
Author(s)
Verheij, D
·
Peres, M
·
Alves, LC
·
Cardoso, S
·
Alves, E
·
Durand, C
·
Eymery, J
·
Tipo de Documento
Article
Year published
2024
Publicado
in RADIATION PHYSICS AND CHEMISTRY, ISSN: 0969-806X
Volume: 224, Páginas: 111945 (11)
Indexing
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Publication Identifiers
SCOPUS: 2-s2.0-85198006995
Wos: WOS:001267379100001
Source Identifiers
ISSN: 0969-806X
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