Publicações

Structural and Raman Characterization of Nanogranular Batio3-Nife2O4 Thin Films Deposited by Laser Ablation on Si/Pt Substrates

AuthID
P-003-C95

Author(s)

Goncalves, JR

Sa, P

Editor(es)

Correia, A; Saenz, JJ; Ordejon, P; Roche, S

Tipo de Documento

Proceedings Paper

Year published

2010

Publicado

in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 11-12 in Physica Status Solidi C-Current Topics in Solid State Physics, ISSN: 1862-6351

Volume: 7, Número: 11-12, Páginas: 2720-2723 (4)

Conference

10Th International Conference on Trends in Nanotechnology (Tnt), Date: SEP 07-11, 2009, Location: Barcelona, SPAIN, Patrocinadores: ICEX & espana-technol life, NSERC/CRSNG, Phantoms Fdn, CIC nanoGUNE Consolider, NanoBasque, DIPC, Univ Autonoma Madrid (UAM), Univ Oviedo, Inst Bioengn Catalonia (IBEC), Univ Barcelona, GDR-I/Nano-I, IJ Cambria Sci, Republique Francaise, Parque Cientifico Madrid (PCM), MINATEC, CEA/LETI, 22@Barcelona, Centro Investigacion Nanomateriales Nanotecnologia (CINN), Wiley-VCH, MANA, Ajuntament Barcelona, Minist Ciencia & Innovac, Adolphe Merkle Inst, FEI Co, Int Iberian Nanotechnol Lab (INL), Physica Status Solidi (PSS), NIMS, Nanoaracat, Frimat, NanoSci, CSIC, ICN, Fundacion Itma, Univ Autonoma Barcelona, AF Off Sci Res

Indexing