Space Charge Measurements with Kelvin Probe Force Microscopy

AuthID
P-011-YS8
3
Author(s)
Faliya, K
·
Kliem, H
·
Tipo de Documento
Article
Year published
2017
Publicado
in IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, ISSN: 1070-9878
Volume: 24, Número: 3, Páginas: 1913-1922 (10)
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Publication Identifiers
Wos: WOS:000405000300066
Source Identifiers
ISSN: 1070-9878
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