Deep-Level Defects in Ga-Doped Silicon Crystals

AuthID
 P-013-1B1
9
Author(s)
Fattah, TOA
·
Markevich, VP
·
De Guzman, JA
·
Abrosimov, NV
·
Binns, J
·
Crowe, I
·
Halsall, MP
·
Peaker, AR
Tipo de Documento
Proceedings Paper
Year published
2023
Publicado
in AIP Conference Proceedings - SILICONPV 2022, THE 12TH INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS, ISSN: 0094-243X
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Source Identifiers
ISSN: 0094-243X
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