High Quality Ion-Induced Secondary Electron Imaging for Mev Nuclear Microprobe Applications

AuthID
 P-000-BFB
5
Author(s)
Teo, EJ
·
Bettiol, AA
·
Watt, F
·
Tipo de Documento
Article
Year published
2004
Publicado
in JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, ISSN: 1071-1023
Volume: 22, Número: 2, Páginas: 560-564 (5)
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Publication Identifiers
SCOPUS: 2-s2.0-2342509631
Wos: WOS:000221092300018
Source Identifiers
ISSN: 1071-1023
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