Dosimetric Study Of Changes Due To X-Ray Doses In Dielectric Conductance Of Thin-Film Capacitors

AuthID
 P-014-YW9
2
Author(s)
SINGH, P
·
Tipo de Documento
Note
Year published
1974
Publicado
in INDIAN JOURNAL OF PURE & APPLIED PHYSICS, ISSN: 0019-5596
Volume: 12, Número: 2, Páginas: 165-166 (2)
Indexing
Wos®
Publication Identifiers
Wos: WOS:A1974T780900023
Source Identifiers
ISSN: 0019-5596
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