Fermi-Level Pinning at the Polysilicon Metal Oxide Interface - Part Ii

AuthID
 P-014-YYP
20
Author(s)
Hobbs, CC
·
Fonseca, LRC
·
Knizhnik, A
·
Dhandapani, V
·
Samavedam, SB
·
Taylor, WJ
·
Grant, JM
·
Dip, LG
·
Triyoso, DH
·
Hegde, RI
·
Gilmer, DC
·
Garcia, R
·
Roan, D
·
Lovejoy, ML
·
Hebert, EA
·
Tseng, HH
·
Anderson, SGH
·
White, BE
·
Tobin, PJ
Tipo de Documento
Article
Year published
2004
Publicado
in IEEE TRANSACTIONS ON ELECTRON DEVICES, ISSN: 0018-9383
Volume: 51, Número: 6, Páginas: 978-984 (7)
Indexing
Wos®
Crossref®81
Google Scholar®
Publication Identifiers
Wos: WOS:000221660100022
Source Identifiers
ISSN: 0018-9383
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