Stability of Zinc Nitride Thin-Film Transistors Under Positive and Negative Bias Stress

AuthID
 P-015-GY9
3
Author(s)
Dominguez M.A.
·
Pau J.L.
·
Tipo de Documento
Article
Year published
2020
Publicado
in Solid-State Electronics, ISSN: 00381101
Volume: 171, Páginas: 107841
Indexing
Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-85085480630
Source Identifiers
ISSN: 00381101
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