Rutherford Backscattering Spectrometry Characterization of Nanoporous Chalcogenide Thin Films Grown at Oblique Angles

AuthID
 P-015-GYQ
5
Author(s)
Martín-Palma R.J.
·
Gago R.
·
Ryan J.V.
·
Pantano C.G.
Tipo de Documento
Article
Year published
2008
Publicado
in Journal of Analytical Atomic Spectrometry, ISSN: 02679477
Volume: 23, Número: 7, Páginas: 981-984 (3)
Indexing
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Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-46149105952
Source Identifiers
ISSN: 02679477
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