Built-In Self-Test Quality Assessment Using Hardware Fault Emulation in Fpgas

AuthID
 P-000-CGG
3
Author(s)
Parreira, A
·
Tipo de Documento
Article
Year published
2004
Publicado
in COMPUTING AND INFORMATICS, ISSN: 1335-9150
Volume: 23, Número: 5-6, Páginas: 537-556 (20)
Conference
Ieee International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Date: APR 18-21, 2004, Location: Stara Lesna, SLOVAKIA, Patrocinadores: IEEE
Indexing
Wos®
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-21644471028
Wos: WOS:000230386100008
Source Identifiers
ISSN: 1335-9150
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