Mixed Current/Voltage Observation Towards Effective Testing of Analog and Mixed-Signal Circuits

AuthID
 P-017-YE1
4
Author(s)
Matos, JS
·
Bell, IM
·
Taylor, GE
Tipo de Documento
Article
Year published
1996
Publicado
in J. Electron. Test.
Volume: 9, Número: 1-2, Páginas: 75-88
Indexing
Dblp®/pt/publications/view/1309121
Publication Identifiers
DBLP: journals/et/SilvaMBT96
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