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Radiation Hardness of Gesi Heterostructures with Thin Ge Layers

AuthID
P-004-1GM

Author(s)

Leitao, JP

Santos, NM

Sobolev, NA

Correia, MR

Stepina, NP

Carmo, MC

Magalhaes, S

Alves, E

Novikov, AV

Shaleev, MV

Lobanov, DN

Krasilnik, ZF

Tipo de Documento

Article

Year published

2008

Publicado

in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, ISSN: 0921-5107

Volume: 147, Número: 2-3, Páginas: 191-194 (4)

Conference

Symposium on Semiconductor Nanostructures Towards Electronic and Optoelectronic Device Applications Held at the 2007 Emrs Spring Meeting, Date: MAY 28-JUN 01, 2007, Location: Strasbourg, FRANCE

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Publication Identifiers

DOI: 10.1016/j.mseb.2007.08.032

SCOPUS: 2-s2.0-38749151931

Wos: WOS:000253798300020

Source Identifiers

ISSN: 0921-5107

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Radiation Hardness of Gesi Heterostructures with Thin Ge Layers

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