Detection of Defects in Automotive Metal Components Through Computer Vision

AuthID
 P-004-5CK
4
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2008
Publicado
in 2008 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-5
Páginas: 934-939 (6)
Conference
Ieee International Symposium on Industrial Electronics, Date: JUN 30-JUL 02, 2008, Location: Cambridge, ENGLAND, Patrocinadores: IEEE
Indexing
Wos®
Scopus®
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Publication Identifiers
SCOPUS: 2-s2.0-57849158391
Wos: WOS:000266702100160
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