Interstitial Carbon-Related Defects in Si1-Xgex Alloys

AuthID
 P-004-5RY
10
Author(s)
Khirunenko, LI
·
Pomozov, YV
·
Sosnin, MG
·
Duvanskii, A
·
Jones, R
·
Briddon, PR
·
Abrosimov, NV
·
Riemann, H
Tipo de Documento
Article
Year published
2007
Publicado
in PHYSICA B-CONDENSED MATTER, ISSN: 0921-4526
Volume: 401, Páginas: 200-204 (5)
Conference
24Th International Conference on Defects in Semiconductors, Date: JUL 22-27, 2007, Location: Albuquerque, NM
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Publication Identifiers
Wos: WOS:000252041000047
Source Identifiers
ISSN: 0921-4526
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