Refinement of the Layered Titanosilicate Am-1 from Single-Crystal X-Ray Diffraction Data

AuthID
 P-004-6BN
6
Author(s)
Lengauer, C
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Tipo de Documento
Article
Year published
2007
Publicado
in ACTA CRYSTALLOGRAPHICA SECTION E-STRUCTURE REPORTS ONLINE, ISSN: 1600-5368
Volume: 63, Número: 11, Páginas: I186-U20 (11)
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Publication Identifiers
SCOPUS: 2-s2.0-35948987543
Wos: WOS:000251281800002
Source Identifiers
ISSN: 1600-5368
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