Transmission Electron Microscopy Investigation of the Structural Damage Formed in Gan by Medium Range Energy Rare Earth Ion Implantation

AuthID
 P-004-GVW
5
Author(s)
Tipo de Documento
Article
Year published
2006
Publicado
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 100, Número: 7, Páginas: 073520 (6)
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Publication Identifiers
SCOPUS: 2-s2.0-33749996171
Wos: WOS:000241248000031
Source Identifiers
ISSN: 0021-8979
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