Failure Mechanism of Aln Nanocaps Used to Protect Rare Earth-Implanted Gan During High Temperature Annealing

AuthID
 P-004-NNZ
7
Author(s)
Nogales, E
·
O'Donnell, KP
·
Briot, O
Tipo de Documento
Article
Year published
2006
Publicado
in APPLIED PHYSICS LETTERS, ISSN: 0003-6951
Volume: 88, Número: 3, Páginas: 1-3 (3)
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Publication Identifiers
SCOPUS: 2-s2.0-31144471624
Wos: WOS:000234757100013
Source Identifiers
ISSN: 0003-6951
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