Real Time Fault Injection Using Enhanced Ocd - A Performance Analysis

AuthID
 P-004-R6J
3
Author(s)
Ferreira, JM
1
Editor(es)
Werner,B
Tipo de Documento
Proceedings Paper
Year published
2006
Publicado
in 21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, Proceedings in DFT, ISSN: 1550-5774
Páginas: 254-262 (9)
Conference
21St Ieee International Symposium on Defect and Fault-Tolerance in Vlsi Systems, Date: OCT 04-06, 2006, Location: Arlington, VA, Patrocinadores: IEEE
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Scopus®
Dblp®/pt/publications/view/155858
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Publication Identifiers
DBLP: conf/dft/FidalgoAF06
SCOPUS: 2-s2.0-38749111829
Wos: WOS:000242580800027
Source Identifiers
ISSN: 1550-5774
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