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Defect-Oriented Testing of Analogue and Mixed Signal Ics

AuthID
P-007-87Q

Author(s)

Santos, MB

Goncalves, FM

Ohletz, M

Teixeira, JP

Tipo de Documento

Article

Year published

1998

Publicado

in Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volume: 2, Páginas: 419-424

Conference

Proceedings of the 1998 5Th Ieee International Conference on Electronics, Circuits and Systems (Icecs'98) - Surfing the Waves of Science and Technology, Date: 7 September 1998 through 10 September 1998, Location: Lisboa, Portugal

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Publication Identifiers

DOI: 10.1109/icecs.1998.814913

SCOPUS: 2-s2.0-0032283790

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Defect-Oriented Testing of Analogue and Mixed Signal Ics

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