Low-Temperature Properties of Compensated Ge Films Used for Cryogenic Thermometers

AuthID
P-007-A83
4
Author(s)
Mitin, VF
·
Kholevchuk, VV
·
5
Editor(es)
Ashok, S; Chevallier, J; Johnson, NM; Sopori, BL; Okushi, H
Tipo de Documento
Proceedings Paper
Year published
2002
Publicado
in DEFECT AND IMPURITY ENGINEERED SEMICONDUCTORS AND DEVICES III in MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS, ISSN: 0272-9172
Volume: 719, Páginas: 445-450 (6)
Conference
Symposium on Defect and Impurity Engineered Semiconductors and Devices Iii Held at the 2002 Mrs Spring Meeting, Date: APR 01-05, 2002, Location: SAN FRANCISCO, CA, Patrocinadores: Mat Res Soc
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-0036447847
Wos: WOS:000178622200066
Source Identifiers
ISSN: 0272-9172
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