Precipitates Segmentation from Scanning Electron Microscope Images Through Machine Learning Techniques

AuthID
 P-007-YHP
6
Author(s)
Papa, JP
·
Pereira, CR
·
Silva, CC
·
Falcao, AX
·
5
Editor(es)
Aggarwal, JK; Barneva, RP; Brimkov, VE; Koroutchev, KN; Korutcheva, ER
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in COMBINATORIAL IMAGE ANALYSIS in Lecture Notes in Computer Science, ISSN: 0302-9743
Volume: 6636, Páginas: 456-468 (13)
Conference
14Th International Workshop on Combinatorial Image Analysis (Iwcia), Date: MAY 23-25, 2011, Location: Madrid, SPAIN, Patrocinadores: Univ Autonoma Madrid, Escuela Politecnica Super
Indexing
Wos®
Scopus®
Dblp®/pt/publications/view/260662
Crossref®
Google Scholar®
Publication Identifiers
DBLP: conf/iwcia/PapaPASFT11
SCOPUS: 2-s2.0-79957648069
Wos: WOS:000303500200040
Source Identifiers
ISSN: 0302-9743
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