Publicações

An Empirical Study on the Usage of Testability Information to Fault Localization in Software

AuthID
P-007-YS3

Author(s)

Gonzalez Sanchez, A

Abreu, R

Gross, HG

Van Gemund, AJC

Editor(es)

William C. Chu; W. Eric Wong; Mathew J. Palakal; Chih-Cheng Hung

Tipo de Documento

Proceedings Paper

Year published

2011

Publicado

in Proceedings of the ACM Symposium on Applied Computing in SAC

Páginas: 1398-1403

Conference

26Th Annual Acm Symposium on Applied Computing, Sac 2011, Date: 21 March 2011 through 24 March 2011, Location: TaiChung, Patrocinadores: ACM Special Interest Group on Applied Computing (SIGAPP);Tunghai University;Taiwan Ministry of Education;Taiwan Bureau of Foreign Trade;Taiwan National Science Council (NSC)

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