A Diagnostic Reasoning Approach to Defect Prediction

AuthID
 P-007-Z7E
3
Author(s)
Gonzalez Sanchez, A
·
Van Gemund, AJC
5
Editor(es)
Kishan G. Mehrotra; Chilukuri K. Mohan; Jae C. Oh; Pramod K. Varshney; Moonis Ali
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics) in Lecture Notes in Computer Science, ISSN: 0302-9743
Volume: 6704 LNAI, Número: PART 2, Páginas: 416-425
Conference
24Th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, Iea/Aie 2011, Date: 28 June 2011 through 1 July 2011, Location: Syracuse, NY, Patrocinadores: The International Society of Applied Intelligence (ISAI)
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Dblp®/pt/publications/view/261358
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Publication Identifiers
DBLP: conf/ieaaie/AbreuGG11
SCOPUS: 2-s2.0-79960529831
Source Identifiers
ISSN: 0302-9743
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