An Epidemic Approach to Dependable Key-Value Substrates

AuthID
P-007-ZYR
4
Author(s)
Tipo de Documento
Proceedings Paper
Year published
2011
Publicado
in Proceedings of the International Conference on Dependable Systems and Networks in DSN Workshops
Páginas: 105-110
Conference
2011 Ieee/Ifip 41St International Conference on Dependable Systems and Networks Workshops, Dsn-W 2011, Date: 27 June 2011 through 30 June 2011, Location: Hong Kong, Patrocinadores: IEEE Comput. Soc. Tech. Comm. Dependable Comput.Fault Tolerance;IFIP Work. Group 10.4 Dependable Comput. Fault Tolerance
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Publication Identifiers
DBLP: conf/dsn/MatosVPO11
SCOPUS: 2-s2.0-80052168239
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