Characterization of Ingan and Inaln Epilayers by Microdiffraction X-Ray Reciprocal Space Mapping

AuthID
P-008-5HF
8
Author(s)
Dolbnya, IP
·
O'Donnell, KP
·
Edwards, PR
·
Tipo de Documento
Proceedings Paper
Year published
2012
Publicado
in Materials Research Society Symposium Proceedings, ISSN: 0272-9172
Volume: 1396, Páginas: 193-198
Conference
2011 Mrs Fall Meeting, Date: 28 November 2011 through 2 December 2011, Location: Boston, MA
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-84864987051
Source Identifiers
ISSN: 0272-9172
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