Low-Frequency Noise as a Diagnostic Tool for Oled Reliability

AuthID
 P-008-DX5
6
Author(s)
Vandamme, LKJ
·
De Leeuw, DM
·
Van De Weijer, P
Tipo de Documento
Proceedings Paper
Year published
2013
Publicado
in 2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
Conference
2013 22Nd International Conference on Noise and Fluctuations, Icnf 2013, Date: 24 June 2013 through 28 June 2013, Location: Montpellier
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Publication Identifiers
SCOPUS: 2-s2.0-84883715374
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