Publicações

Ion Microprobe Study of the Scale Formed During High Temperature Oxidation of High Silicon En-1.4301 Stainless Steel

AuthID
P-000-V4B

Author(s)

Paul, A

Elmrabet, S

Alves, LC

da Silva, MF

Soares, JC

Odriozola, JA

Editor(es)

Moretto P.Bonnin-Mosbah M.

Tipo de Documento

Article

Year published

2001

Publicado

in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN: 0168-583X

Volume: 181, Número: 1-4, Páginas: 394-398 (5)

Conference

7Th International Conference on Nuclear Microprobe Technology and Applications, Date: SEP 10-15, 2000, Location: BORDEAUX, FRANCE, Patrocinadores: CNRS, CEA, CNRS Univ Bordeaux, CNRS Minist Culture & Commun

Indexing

Wos^®

Scopus^®

Google Scholar^®

Metadata
Fontes

Publication Identifiers

DOI: 10.1016/s0168-583x(01)00358-5

SCOPUS: 2-s2.0-0035388395

Wos: WOS:000170885400068

Source Identifiers

ISSN: 0168-583X

Export Publication Metadata

Lista Marked

Adicionar à lista Marked

Info

At this moment we don't have any links to full text documens.

Ion Microprobe Study of the Scale Formed During High Temperature Oxidation of High Silicon En-1.4301 Stainless Steel

Links Úteis

Ajuda

Autenticação Federada (Clique na imagem)

Ion Microprobe Study of the Scale Formed During High Temperature Oxidation of High Silicon En-1.4301 Stainless Steel

Links Úteis

Ajuda