Publicações

Electrode Roughness and Interfacial Mixing Effects on the Tunnel Junction Thermal Stability

AuthID
P-000-VC2

Author(s)

Cardoso, S

Freitas, PP

Zhang, ZG

Wei, P

Barradas, N

Soares, JC

Editor(es)

Ching W.Y.Fidler J.Folks L.Katine J.A.

Tipo de Documento

Article

Year published

2001

Publicado

in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979

Volume: 89, Número: 11, Páginas: 6650-6652 (3)

Conference

8Th Joint Mmm/Intermag Conference, Date: JAN 08-11, 2001, Location: SAN ANTONIO, TEXAS, Patrocinadores: Motorola Labs, TDK Corp, IBM, Toda Kogyo Corp, EMTEC Magnet GmbH, Quantum, Seagate Res, Sony Corp, Magnequench Technol Ctr, AJA Int Inc, Digital Measurement Syst

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