Bottom-Up Methodology for Test Preparation and Refinement

AuthID
 P-008-NGK
6
Author(s)
Gracio, JA
·
Bicudo, PA
·
Rua, NN
·
Almeida, CFB
·
1
Editor(es)
Anon
Tipo de Documento
Proceedings Paper
Year published
1989
Publicado
in Proceedings - IEEE International Symposium on Circuits and Systems, ISSN: 0271-4310
Volume: 2, Páginas: 949-952
Conference
Ieee International Symposium on Circuits and Systems 1989, the 22Nd Iscas. Part 1, Date: 8 May 1989 through 11 May 1989, Location: Portland, OR, USA
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0024946663
Source Identifiers
ISSN: 0271-4310
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