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Comparison of Diffusion Length Measurements from the Flying Spot Technique and the Photocarrier Grating Method in Amorphous Thin Films

AuthID
P-008-R1N

Author(s)

Vieira, M

Fantoni, A

Martins, R

Koynov, S

Wang, F

Grebner, S

Schwarz, R

Editor(es)

Anon

Tipo de Documento

Proceedings Paper

Year published

1994

Publicado

in Conference Record of the IEEE Photovoltaic Specialists Conference, ISSN: 0160-8371

Volume: 1, Páginas: 575-578

Conference

Proceedings of the 24Th Ieee Photovoltaic Specialists Conference. Part 2 (Of 2), Date: 5 December 1994 through 9 December 1994, Location: Waikoloa, HI, USA, Patrocinadores: IEEE Electron Devices Society

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Scopus^®

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Publication Identifiers

SCOPUS: 2-s2.0-0028693517

Source Identifiers

ISSN: 0160-8371

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Comparison of Diffusion Length Measurements from the Flying Spot Technique and the Photocarrier Grating Method in Amorphous Thin Films

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Comparison of Diffusion Length Measurements from the Flying Spot Technique and the Photocarrier Grating Method in Amorphous Thin Films

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