Publicações

Role Of Sio At Tco/P Interface On The Electrical-Properties Of The P/I Junction

AuthID
P-008-T0N

Author(s)

CARVALHO, C

DENIJS, JMM

MARTINS, R

GUIMARAES, L

Editor(es)

MADAN, A; HAMAKAWA, Y; THOMPSON, MJ; TAYLOR, PC; LECOMBER, PG

Tipo de Documento

Proceedings Paper

Year published

1991

Publicado

in AMORPHOUS SILICON TECHNOLOGY - 1991 in MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS

Volume: 219, Páginas: 487-492 (6)

Conference

Symp At The 1991 Spring Meeting Of The Materials Research Soc : Amorphous Silicon Technology, Date: APR 30-MAY 01, 1991, Location: ANAHEIM, CA, Patrocinadores: MAT RES SOC

Indexing

Wos^®

Google Scholar^®

Metadata
Fontes

Publication Identifiers

DOI: 10.1557/proc-219-487

Wos: WOS:A1991BU93V00074

Export Publication Metadata

Lista Marked

Adicionar à lista Marked

Info

At this moment we don't have any links to full text documens.

Role Of Sio At Tco/P Interface On The Electrical-Properties Of The P/I Junction

Links Úteis

Ajuda

Autenticação Federada (Clique na imagem)

Role Of Sio At Tco/P Interface On The Electrical-Properties Of The P/I Junction

Links Úteis

Ajuda