Ic Defects-Based Testability Analysis

AuthID
 P-008-VBT
3
Author(s)
Sousa, JJT
·
Tipo de Documento
Proceedings Paper
Year published
1992
Publicado
in Digest of Papers - International Test Conference, ISSN: 0743-1686
Páginas: 500-509
Conference
Proceedings of the International Test Conference 1991, Date: 26 October 1991 through 30 October 1991, Location: Nashville, TN, USA, Patrocinadores: IEEE Computer Soc;IEEE Philadelphia Section
Indexing
Scopus®
Publication Identifiers
SCOPUS: 2-s2.0-0026677401
Source Identifiers
ISSN: 0743-1686
Export Publication Metadata
Lista Marked
 Adicionar à lista Marked
Info
At this moment we don't have any links to full text documens.

Um espaço para investigadores e suas Instituições

Links Úteis

Ajuda

© 2024 CRACS & Inesc TEC - All Rights Reserved Política de Privacidade | Terms of Service