in JOURNAL OF PHYSICS-CONDENSED MATTER, ISSN: 0953-8984
Volume: 17, Número: 22, Páginas: S2211-S2217 (7)
Conference
1St International Workshop on Coordination Action on Defects Relevent to Engineering Silicon-Based Devices, Date: SEP 26-28, 2004, Location: Catania, ITALY, Patrocinadores: European Commiss Framework 6 IST Programme