Tunneling Escape Time from a Semiconductor Quantum Well in an Electric Field

AuthID
P-009-F16
3
Author(s)
Ujevic, S
·
Avrutin, EA
Tipo de Documento
Article
Year published
2009
Publicado
in JOURNAL OF APPLIED PHYSICS, ISSN: 0021-8979
Volume: 106, Número: 11, Páginas: 113701 (7)
Indexing
Publication Identifiers
SCOPUS: 2-s2.0-72449200652
Wos: WOS:000272838600055
Source Identifiers
ISSN: 0021-8979
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