Structural Studies and Influence of the Structure on the Electrical and Optical Properties of Microcrystalline Silicon Thin Films Produced by Rf Sputtering

AuthID
 P-000-ZGK
3
Author(s)
Adriaenssens, GJ
Tipo de Documento
Article
Year published
2000
Publicado
in THIN SOLID FILMS, ISSN: 0040-6090
Volume: 370, Número: 1-2, Páginas: 128-136 (9)
Indexing
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Scopus®
Crossref®17
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Publication Identifiers
SCOPUS: 2-s2.0-0033690663
Wos: WOS:000087942200021
Source Identifiers
ISSN: 0040-6090
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