Low Power Bist by Filtering Non-Detecting Vectors

AuthID
 P-000-ZXK
10
Author(s)
Manich, S
·
Gabarro, A
·
Lopez, M
·
Figueras, J
·
Girard, P
·
Guiller, L
·
Tipo de Documento
Article
Year published
2000
Publicado
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 16, Número: 3, Páginas: 193-202 (10)
Conference
6Th Ieee International O-Line Testing Workshop, Date: JUL 03-05, 2000, Location: MALLORCA, SPAIN
Indexing
Wos®
Scopus®
Crossref®19
Google Scholar®
Publication Identifiers
SCOPUS: 2-s2.0-0033689730
Wos: WOS:000088072600006
Source Identifiers
ISSN: 0923-8174
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