in Proceedings of IEEE International Symposium on High Assurance Systems Engineering in HASE, ISSN: 1530-2059
Páginas: 125-134
Conference
11Th Ieee High Assurance Systems Engineering Symposium, Hase 2008, Date: 3 December 2008 through 5 December 2008, Location: Nanjing, Patrocinadores: Nanjing University;IEEE Computer Society;IEEE Reliability Society